Welcome to I-Cube: South Africa's leading provider of
License
Plate Recognition; Facial
Recognition & Image
Analysis 
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Welcome to I-Cube: South Africa's leading provider of
License
Plate Recognition; Facial
Recognition & Image
Analysis |
Clemex continues success in the steel industry
LONGUEUIL, QC, Aug. 10 /CNW Telbec/ - Clemex Technologies Inc. (TSX
Venture: CXG.a) announces today that it has received five new image analysis
system orders from Canadian Steelmaker IPSCO of Regina, Saskatchewan. Total
sales to the IPSCO group amounts to $225,000 in addition to a first order of
$103,000 placed in April 2006. Two of the five new systems are for plants in
the United States, while the three others were shipped to Saskatchewan and
Alberta. All instruments will be used for quality control of raw steel and
steel tubes used in pipeline construction.
Clement Forget, president and CEO of Clemex Technologies commented: "The
increasing demand for energy of all sources combined with the high level of
activity in the metals, mining and refining sectors is a very good opportunity
for Clemex. The resurge in demand for our image analysis systems in these
application fields largely compensate for the slight slowdown in the
manufacturing sector." He added: "We foresee more sales in the steel industry
in the short term with the upcoming release of our newly updated Inclusions
Rating software this fall."
I-CUBE develops, manufactures and markets image
analysis systems and software used by quality control and research microscopy
laboratories. I-CUBE customer base spans over many countries in America,
Europe, Asia and encompasses major Research and Development Centers,
prestigious Universities and large manufacturing industries in various fields
including automotive, aerospace, raw materials manufacturing, pharmaceuticals,
mining and other sectors..
Software Comparison Chart
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Captiva |
Vision Lite |
Vision PE |
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| Acquisition | |||
| Capture images from TWAIN, FireWire, or analog cameras |
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| Multiple camera support |
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| Full size live image preview |
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| Support for multiple calibration settings according to camera and magnification |
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| Direct camera setting control from software (supported USB & FireWire cameras) |
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| Live shading corrector for equalizing lighting |
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| Save/Load tif, bmp, pcx, tga, psd, and jpg images |
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| Multi-Layer grab, with or without motorized stage |
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| Mosaic, with or without motorized stage |
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| Non destructive annotations |
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| Image Display | |||
| View
multiple images with image viewers, compare with live image |
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| Display
captured image in grey scale, color, or pseudocolor |
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| Zoom
in/zoom out |
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| Image
fit to window |
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| Image
panning |
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| Four
desktop views for easy viewing of
windows |
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| Multiple
non-destructive annotation tools, including: freehand lines,
squares, elipses, arcs, polylines, polygons, insert bitmaps, text boxes,
full control over scale-line parameters |
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| Image Processing | |||
| Custom routine
development, unlimited number of
routines |
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| Enhancement filters,
such as: delineate, smooth, sharpen, invert ... |
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4 included
|
over 30
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| Manual grey threshold |
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| Automatic grey
threshold |
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| Color threshold
according to hue, saturation and intensity |
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| 12 workable bitplanes |
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| Binary operations,
such as: chord size, trap, boolean, transfer… |
|
13 included
|
over 35
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| Automatic Object and Field Measurement Tools | |||
| Object measures
including: area, perimeter, length, width, angle, aspect ratio,
sphericity, roundness ... |
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8 included
|
over 60
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| Field measure
including: area, average area, area percent, count, density, intensity,
horizontal / vertical intercept ... |
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9 included
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over 20
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| Relative Measures : object percent |
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| Relative Measures: area percent |
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| Object transfer by
limits and/or custom parameters |
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| Unlimited Custom
measurements |
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| Analysis
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|||
| Direct
point-to-point measurement tools,
including: freehand lines, angles, arcs, and polylines/polygons |
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| Automatic object and
field mapping, requires motorized stage |
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| Results display
in histogram, scatter plot, or tabular format |
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| Export results to MS
Excel |
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| Application Packages | |||
| Dendritic arm spacing |
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optional
|
optional
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| Grain and cell sizing |
optional
|
optional
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| Thickness measuring |
optional
|
optional
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| Particle sizing |
optional
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optional
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| Phase analysis |
optional
|
optional
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| Fibers Analysis |
optional
|
optional
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| Cast iron ASTM A247 module |
optional
|
optional
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| Inclusion content ASTM E1245 |
optional
|
optional
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| Report Generation | |||
| Automated report generator based on user customized excel templates |
|
optional
|
optional
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| Enhanced Add-Ons | |||
| Clemex R'Kive Explorer -
tightly integrated image database |
optional
|
optional
|
optional
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| Motorized Stage / Joystick
controller for X,Y,and Z - recommended
for mosaic, mutli-layer grab features and multiple field analysis |
optional
|
optional
|
optional
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| 3D rendering |
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|
optional
|
| Metallography
of Titanium Alloys Published in: Advanced Materials & Processes, December 2005 |
| Advanced
Imaging Technologies Published in: Advanced Materials & Processes, January 2004 |
| Histomorphometric.
Evaluation of Intervertabral Implants Published in: Advanced Imaging, June 2003 |
| Image
Analysis Helps Develop Products Published in: Quality, November 2002 |
| Image
Analysis Tests Intervertebral Implants Published in: Biophotonics, October 2002 |
| Automated
Image Analysis for Ore Petrography Published in: Canadian Mining Journal, August 2002 |
| Image
Analysis Used to Facilitate Cancer Research Published in: American Biotechnology Laboratory, September 2001 |
| Image
Analysis of Aluminum Castings Published in: Advanced Materials & Processes, August 2001 |
| Costs
are key to microscopy systems Published in: Vision Systems Design, June 2001 |
| Improving
Quality With Computer-Aided Microscopy Published in: Industrial Heating, November 2000 |
| Image
Analysis System Packs Multifunctionality Published in: Photonics, December 1999 |
| Metallurgy
lab upgrades to image-analysis system Published in: Quality Magazine, June 1999 |
| Image
Analysis Gain the Quality Edge Published in: Photonics Spectra, November 1997 |
| Using
Image Analysis to Quantify Microstructural Characteristics Published in: Industrial Heating, November 1998 |
| Image
Analysis System Distinguishes Drug Particle Sizes Published in: Photonics Spectra, October 1998 |
| Managing
Very Large-Scale Digital Images in Microscopy Published in: Microscopy and Analysis, July 1998 |
| Image
Analysis Eliminates Material Variations Published in: Quality, December 1997 |
| Automating
Quality Control With Image Analysis Published in: Today's Chemist at Work, December 1997 |
| Grain
Sizing of Anodized Aluminum by Color Image Analysis Published in: Materials Characterization Vol.36, Number4/5, April/June 1996 |
Image Analysis Reports |
I-Cube provides security and recognition systems in the following industry:
Tensile Stress Stage for Microscopes Allows Real Time Observation of Materials |
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Linkam are pleased to announce the latest addition to their range of material characterization systems – the TST350 tensile stress stage for the visualisation and measurement of physical properties of samples. The TST350 replaces the standard sample stage on most light microscopes including those with spectroscopy options enabling the user to view their sample using either reflected or transmitted light and have the ability to digitally capture images of the sample. Alternatively, it may be used in conjunction with Linkam’s own versatile Imaging Station. About the applications: For 25 years, Linkam has been producing specialist stages to enable sample morphology to be viewed as a function of change of temperature. As with many techniques, users are now requesting more information from a single experiment and Linkam’s TST350 stage delivers this for samples in the mm length range and thicknesses down to a few microns. Early evaluators (adopters) of the system have demonstrated its use to study polymer and adhesive films. It is expected to find applications in many other industries from pharmaceuticals and the life sciences to consumer products. Systems are in use in laboratories in the USA, Japan, Korea and the Netherlands ensuring the validity and performance of the new system as it is now commercially released. About the product: The TST350 is built with two precision ground stainless steel lead screws to maintain perfect uniform vertical and horizontal sample alignment. Sample jaws move in opposite directions to maintain sample in both reflected and transmitted microscope fields of view. This also means other transmitted techniques such as x-ray, needed for internal observation of sample structure can be used. As is expected of Linkam equipment, temperature control and accuracy is second to none, with a range from -196 to 350°C with 0.1°C control and rates up to 30°C/ min. Most importantly, there is virtually no temperature feedback to the measurement of force. The sample chamber is gas sealed and can be controlled with various gases via the gas valves built onto sides of the stage. The intuitive Linksys 32 DV software enables full control of temperature, motor for jaw position, data and high resolution image capture. Speaking about the new stage, founder, Arnold Kamp, says discussions with our users have shown that the addition of the new stage will provide insight into materials properties monitored in real time. As well as being able to view and capture changes with varying temperature, we can now offer the user the ability to apply tensile stress to the sample leading to quantitative comparisons.” Linkam, with a continuing eye to future developments, see the tensile stage as a new platform for materials characterisation measurements on the mm/micron scales thus meeting the multi-disciplinary requirements of the modern analysis and R&D laboratories. |
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